Jenő Gubicza

The microstructure of polycrystalline materials (crystallite size, shape, type and amount of lattice defects) fundamentally affects the properties. The focus of my research is the investigation of the relationship between the production conditions, microstructure and mechanical properties of new, innovative materials. I primarily study the microstructure by X-ray diffraction line profile analysis, which is a non-destructive method, and can determine the crystallite size distribution as well as the type and amount of lattice defects with good statistics.

Keywords

microstructure, mechanical properties, X-ray diffraction, lattice defects

Highlighted publications

2014 – Gubicza, J – X-ray line profile analysis in Materials Science – mtmt.hu
2017 – Gubicza, J. – Defect Structure and Properties of Nanomaterials: Second and Extended Edition – mtmt.hu
2019 – Gubicza, Jenő – Annealing-induced hardening in ultrafine-grained and nanocrystalline materials – mtmt.hu
2018 – Gubicza, J. et al. – Exceptionally high strength and good ductility in an ultrafine-grained 316L steel processed by severe plastic deformation and subsequent annealing – mtmt.hu
2024 – Nagy, Péter et al. – Mapping the microstructure and the mechanical performance of a combinatorial Co–Cr–Cu–Fe–Ni–Zn high-entropy alloy thin film processed by magnetron sputtering technique – mtmt.hu